1. Brent A. Holcombe & Brock J. LaMeres, "Alignment/Retention Device for Connector-Less Probe", US Patent 6,822,466, November 23, 2004. (PDF)
  2. Brock J. LaMeres & Kenneth W. Johnson, "Electronic Probe Extender",US Patent 7,025,628, April 11, 2006. (PDF)
  3. Brock J. LaMeres, Brent A. Holcombe, & Kenneth Johnson, "Probes with perpendicularly disposed spring pins, and methods of making and using same", US Patent 7,046,020, May 16, 2006. (PDF)
  4. Brent A. Holcombe, Brock J. LaMeres, & Donald M. Logelin, "Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts", US Patent 7,116,121, October 3, 2006. (PDF)
  5. Brock J. LaMeres, Brent A. Holcombe, & Kenneth Johnson, "Apparatus, method, and kit for probing a pattern of points on a printed circuit board", US Patent 7,145,352, December 5, 2006. (PDF)
  6. Brock J. LaMeres, Brent A. Holcombe, & Glenn Wood, "Incorporation of isolation resistor(s) into probes using probe tip spring pins", US Patent 7,183,781, February 27, 2007. (PDF)
  7. Joseph Groshong, Brock J. LaMeres, & Brent A. Holcombe, "Signal Probe and Probe Assembly", US Patent 7,242,202, July 10, 2007. (PDF)
  8. Brock J. LaMeres, Brent A. Holcombe, & Kenneth Johnson, "Probe Retention Kit, and System and Method for Probing a Pattern of Points of a PCB", US Patent 7,242,203, July 10, 2007. (PDF)
  9. Glenn Wood, Donald M. Logelin, Brock J. LaMeres, & Brent A. Holcombe,  "Regenerator Probe", US Patent 7,282,935, Oct 16, 2007. (PDF)
  10. Brock J. LaMeres & Brent A. Holcombe, "Probe having a frame to align spring pins perpendicularly to a printed circuit board, & method of making same", US Patent 7,323,892, Jan 29, 2008. (PDF)
  11. Kenneth Johnson & Brock J. LaMeres, "Board-to-Board Electronic Interface Using Hemi-Ellipsoidal Surface Features", US Patent 7,338,292, Mar 4, 2008. (PDF)
  12. Brent Holcombe, Brock J. LaMeres, & Kenneth Johnson, "Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket", US Patent 7,372,284, May 13, 2008. (PDF)
  13. Brock J. LaMeres, Brent Holcombe, & Kenneth Johnson, "Probe accessories, and methods for probing test points using same", US Patent 7,492,173, February 17, 2009. (PDF)